Historique de la page

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{color:#000080}{*}Local :*{color} {color:#800000}{*}1176{*}{color}

{color:#000080}{*}Usagers :*{color}

{color:#800000}Saman Choubak (saman.choubak@polymtl.ca){color}

{color:#000080}{*}Responsable:*{color}

{color:#800000}Pierre Lévesque (p.levesque@umontreal.ca){color}
{color:#800000}Khalid Laaziri (khalid.laaziri@umontreal.ca).{color}


{color:#000080}{*}Technicien:*{color}

{color:#800000}Joël Bouchard (joel.bouchard@polymtl.ca).{color}

!system LEEM.JPG|align=center,width=377,height=272!


h3. Description
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Low Energy Electron Microscope FE-LEEM P90 de la compagnie Specs

* 5 nm resolution
* 90° magnetic deflector
* Cold Field emitter
* Energy filter (optional)
* Rapid LEED/LEEM switching
* Fast sample exchange
* Energy filtered PEEM with focussing UV source UVS 300
* Aberration corrector, upgrade option, <2nm resolution


h3. Procédures
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[brano:Laboratoires]
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